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Subject [IEEE] Attended relation deep network on facial dynamics (by Seong Tae Kim)is accepted in IEEE Trans. on Information Forensics & Security
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Date 2018-11-18
Attended relation deep network on facial dynamics has been accepted as regular paper in IEEE Transactions on Information Forensics & Security.

The title is "Attended Relation Feature Representation of Facial Dynamics for Facial Authentication". The paper contribution is to propose new attended relation deep network to represent the relation feature on facial dynamics. In this paper, the relation feature representation on facial dynamics is proved to be useful to highly accurate facial authentication.
This paper has been written by Seong Tae Kim and Yong Man Ro.